TECHNICAL PAPERS: X-ray
Dage Test Systems have published a number of Technical Papers - please click to download a full copy of your selected article.
1) X-ray Tube Selection Criteria for BGA/CSP X-ray Inspection [view pdf] (1.10MB)
2) Implications Of Using Lead Free Solders On X-ray Inspection Of Flip Chips And BGA's [view pdf] (2.06MB)
3) Consideration For Minimizing Radiation Doses To Components During X-ray Inspection [ view pdf ] (501.1kb)
4) Selection Criteria For X-ray Inspection Systems For BGA And CSP Solder Joint Analysis [view pdf] (391.4kb)
5) Investigating Voids - please click here to view this article - www.circuitsassembly.com
6) Improvements In Digital Detector Technology For X-ray Systems [view pdf] (614kb)
7) Using Digital X-ray Inspection For Process Control [view pdf] (792kb)
8) Does PCB Pad Finish Affect Voiding Levels In Lead-Free Assemblies? [view pdf] (719kb)
9) SMART Group Ball Grid Array Inspection Workshop - presented by Bob Willis. Please click here to view the full
presentation (2MB)
10) X-ray Inspection For Electronic Balled Devices - presented by Keith Bryant at the SMART Group Workshop. Please
click here to view the full presentation (2MB)
11) X-ray Inspection for Nano-technology [view pdf] (1.6MB)
12) Overview of the Lead-free Technology Forum & Workshop sponsored by Dage Inc which was published by Advanced Packaging magazine. Please click here to view full article.
13) Lead Free Inspection Methods - presented by Keith Bryant, Dage and Tom Perrett, Soldertec at Southern Manufacturing 2006. To view the presentation please click here (6 MB).
14) Cost Benefit Analysis for Inspection Equipment - presented by Keith Bryant at SMART Group Lead-Free Roadshow, South Africa 2006 [view pdf] (2.2MB)
15) Correlating The Presence Of Popcorned BGA Devices - presented by Dr David Bernard at SMTA Chicago 2006 [view pdf) (1MG)
16) Advances in X-ray For Nanotechnology - presented by Keith Bryan at the EMPC Technical Conference Oulu 2007. To view the presentation please click here
17) X-ray Technology - Myth Explained by Keith Bryant. To view this article please click here
18) Beating The Chip Counterfeiters by Keith Bryant. To view this article please click here
19) To read Dr David Bernard's latest article on the A - Z of X-ray Inspection please click here
20) Quality & Reliability Investigation of Printed Circuit Board Micro-Vias by X-ray Inspection. .
To view this Paper please click here
21) Common Process Identification of QFN Packages using Optical and X-ray Inspection.
To view this Paper please click here
22) Advances in X-ray Tube Technology. To view this article please click here
23) Modern 2D X-ray Tackles BGA Defects. To view this article please click here