How do I know what part of the sample or inspection area I am looking at in the x-ray image? (Particularly when I am at high mag
The operator can quickly and simply obtain a ‘navigation map’ x-ray image of the entire inspection area, or of a single board or component, through the Dage "Image Wizard" operating software. The navigation map is built up from a sequence of x-ray images like a mosaic. The Dage "Image Wizard" software provides a location box on the navigation map that clearly identifies where in the sample the x-ray inspection system is looking. As the location box automatically adjusts in size over the navigation map as the magnification changes, relative to the size of the actual area being shown in the main x-ray image, the operator always knows where they are inspecting on the sample, whatever the magnification used. The navigation map and location box are automatically saved alongside the main x-ray image (as shown in the example below of an oblique angle view of a flip chip at medium magnification). In this way, the location and nature of the fault can be quickly identified once the sample has been removed from the inspection system to allow rework and repair to be quickly realised.

We do not require the use of laser pointers or separate optical cameras to show the inspection location.
As the Dage navigation map is an x-ray image, both sides of the board can be seen at the same time, unlike in an optical image where only one side can be seen. Therefore, bottom-side fault locations are clearly identified and do not have to be inferred from their relative position to the side that can be seen, which could make subsequent fault location for rework and repair more confusing.
New inspection locations to be investigated within the sample can be quickly selected by simple mouse click on to the navigation map. The operating software quickly drives the manipulator to the necessary position. The oblique angle view currently being displayed will also be used in the new location. The software and system design ensures that the sample CANNOT collide with any other part of the system as the new view is achieved.